Manan Syal, Michael S. Hsiao. Untestable Fault Identification using Recurrence Relations and Impossible Value Assignments. In 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India. pages 481-486, IEEE Computer Society, 2004. [doi]
Abstract is missing.