Integrating on-chip temperature sensors into DfT schemes and BIST architectures - researchr publication

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Vladimir Székely, Márta Rencz, Bernard Courtois. Integrating on-chip temperature sensors into DfT schemes and BIST architectures. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 440-445, IEEE Computer Society, 1997. [doi]

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