Fumihiko Tachibana, Hironori Sato, Takahiro Yamashita, Hiroyuki Hara, Takeshi Kitahara, Shuou Nomura, Fumiyuki Yamane, Yoshiro Tsuboi, Keiko Seki, Shuuji Matsumoto, Yoshinori Watanabe, Mototsugu Hamada. A process variation compensation scheme using cell-based forward body-biasing circuits usable for 1.2V design. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. pages 29-32, IEEE, 2008. [doi]
Abstract is missing.