Friedrich Taenzler, Thomas Novak 0003, Erich Kubalek. Contactless characterization of microwave integrated circuits by device internal indirect electro-optic probing. In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 120-122, IEEE, 1993. [doi]
Abstract is missing.