Mahdi Taheri, Mohammad Hasan Ahmadilivani, Maksim Jenihhin, Masoud Daneshtalab, Jaan Raik. APPRAISER: DNN Fault Resilience Analysis Employing Approximation Errors. In Maksim Jenihhin, Hana Kubátová, Nele Metens, Jaan Raik, Foisal Ahmed, Jan Belohoubek, editors, 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023, Tallinn, Estonia, May 3-5, 2023. pages 124-127, IEEE, 2023. [doi]
Abstract is missing.