Test Compression for FPGAs

Mehdi Baradaran Tahoori, Subhasish Mitra. Test Compression for FPGAs. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-9, IEEE, 2006. [doi]

Authors

Mehdi Baradaran Tahoori

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Subhasish Mitra

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