Mehdi Baradaran Tahoori, Subhasish Mitra. Test Compression for FPGAs. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-9, IEEE, 2006. [doi]
@inproceedings{TahooriM06, title = {Test Compression for FPGAs}, author = {Mehdi Baradaran Tahoori and Subhasish Mitra}, year = {2006}, doi = {10.1109/TEST.2006.297645}, url = {http://dx.doi.org/10.1109/TEST.2006.297645}, researchr = {https://researchr.org/publication/TahooriM06}, cites = {0}, citedby = {0}, pages = {1-9}, booktitle = {2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006}, editor = {Scott Davidson and Anne Gattiker}, publisher = {IEEE}, isbn = {1-4244-0292-1}, }