Wei Tai, Lele Jiang, Wang Lei, Song Wen, Lifu Chang, Yuhua Cheng. Characteristics of n-MOSFETs with stress effects from neighborhood devices. In IEEE 10th International Conference on ASIC, ASICON 2013, Shenzhen, China, October 28-31, 2013. pages 1-3, IEEE, 2013. [doi]
@inproceedings{TaiJLWCC13,
title = {Characteristics of n-MOSFETs with stress effects from neighborhood devices},
author = {Wei Tai and Lele Jiang and Wang Lei and Song Wen and Lifu Chang and Yuhua Cheng},
year = {2013},
doi = {10.1109/ASICON.2013.6812059},
url = {http://dx.doi.org/10.1109/ASICON.2013.6812059},
researchr = {https://researchr.org/publication/TaiJLWCC13},
cites = {0},
citedby = {0},
pages = {1-3},
booktitle = {IEEE 10th International Conference on ASIC, ASICON 2013, Shenzhen, China, October 28-31, 2013},
publisher = {IEEE},
isbn = {978-1-4673-6415-7},
}