Wei Tai, Lele Jiang, Wang Lei, Song Wen, Lifu Chang, Yuhua Cheng. Characteristics of n-MOSFETs with stress effects from neighborhood devices. In IEEE 10th International Conference on ASIC, ASICON 2013, Shenzhen, China, October 28-31, 2013. pages 1-3, IEEE, 2013. [doi]
Abstract is missing.