A parallel-in-time method for the transient simulation of SOI devices with drain current overshoots

Gwo-Chung Tai, Can E. Korman, Isaak D. Mayergoyz. A parallel-in-time method for the transient simulation of SOI devices with drain current overshoots. IEEE Trans. on CAD of Integrated Circuits and Systems, 13(8):1035-1044, 1994. [doi]

Abstract

Abstract is missing.