Non-scan design for testable data paths using thru operation - researchr publication authors

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Katsuyuki Takabatake, Toshimitsu Masuzawa, Michiko Inoue, Hideo Fujiwara. Non-scan design for testable data paths using thru operation. In Proceedings of the ASP-DAC '97 Asia and South Pacific Design Automation Conference, Nippon Convention Center, Chiba, Japan, January 28-31, 1997. pages 313-318, IEEE, 1997. [doi]

This author has not been identified. Look up 'Katsuyuki Takabatake' in GoogleThis author has not been identified. Look up 'Toshimitsu Masuzawa' in GoogleThis author has not been identified. Look up 'Michiko Inoue' in GoogleThis author has not been identified. Look up 'Hideo Fujiwara' in Google

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