Katsuyuki Takabatake, Toshimitsu Masuzawa, Michiko Inoue, Hideo Fujiwara. Non-scan design for testable data paths using thru operation. In Proceedings of the ASP-DAC '97 Asia and South Pacific Design Automation Conference, Nippon Convention Center, Chiba, Japan, January 28-31, 1997. pages 313-318, IEEE, 1997. [doi]
@inproceedings{TakabatakeMIF97,
title = {Non-scan design for testable data paths using thru operation},
author = {Katsuyuki Takabatake and Toshimitsu Masuzawa and Michiko Inoue and Hideo Fujiwara},
year = {1997},
doi = {10.1109/ASPDAC.1997.600168},
url = {http://dx.doi.org/10.1109/ASPDAC.1997.600168},
researchr = {https://researchr.org/publication/TakabatakeMIF97},
cites = {0},
citedby = {0},
pages = {313-318},
booktitle = {Proceedings of the ASP-DAC '97 Asia and South Pacific Design Automation Conference, Nippon Convention Center, Chiba, Japan, January 28-31, 1997},
publisher = {IEEE},
isbn = {0-7803-3663-1},
}