Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu. A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault Simulations. In 17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA. pages 64-69, IEEE Computer Society, 1999. [doi]
@inproceedings{TakahashiBT99, title = {A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault Simulations}, author = {Hiroshi Takahashi and Kwame Osei Boateng and Yuzo Takamatsu}, year = {1999}, url = {http://csdl.computer.org/comp/proceedings/vts/1999/0146/00/01460064abs.htm}, researchr = {https://researchr.org/publication/TakahashiBT99}, cites = {0}, citedby = {0}, pages = {64-69}, booktitle = {17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA}, publisher = {IEEE Computer Society}, isbn = {0-7695-0146-X}, }