Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu. A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault Simulations. In 17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA. pages 64-69, IEEE Computer Society, 1999. [doi]
Abstract is missing.