Kwame Osei Boateng - researchr alias

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Viewing Publication 1 - 13 from 13

2020

PSTRM: Privacy-aware sociopsychological trust and reputation model for wireless sensor networksHenry Nunoo-Mensah, Kwame Osei Boateng, James Dzisi Gadze. ppna, 13(5):1505-1525, 2020. [doi]

2018

The adoption of socio- and bio-inspired algorithms for trust models in wireless sensor networks: A surveyHenry Nunoo-Mensah, Kwame Osei Boateng, James D. Gadze. ijcomsys, 31(7), 2018. [doi]

2017

Tamper-aware authentication framework for wireless sensor networksHenry Nunoo-Mensah, Kwame Osei Boateng, James D. Gadze. iet-wss, 7(3):73-81, 2017. [doi]

2015

A Retrofit Design Science Methodology for Smart Metering Design in Developing CountriesJulius Quarshie Azasoo, Kwame Osei Boateng. iccsa 2015: 1-7 [doi]

2003

BIST-Aided Scan Test - A New Method for Test Cost ReductionTakahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama. vts 2003: 359-364 [doi]

2002

On diagnosing multiple stuck-at faults using multiple and singlefault simulation in combinational circuitsHiroshi Takahashi, Kwame Osei Boateng, Kewal K. Saluja, Yuzo Takamatsu. tcad, 21(3):362-368, 2002. [doi]

2001

A Method of Static Compaction of Test StimuliKwame Osei Boateng, Hideaki Konishi, Tsuneo Nakata. ats 2001: 137-144 [doi]

2000

General BIST-Amenable Method of Test Generation for Iterative Logic ArraysKwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu. vts 2000: 171-178 [doi]

1999

Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault SimulatorsHiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Nobuhiro Yanagida. ats 1999: 341-346 [doi]

A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault SimulationsHiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu. vts 1999: 64-69 [doi]

1998

Diagnosis of Single Gate Delay Faults in Combinational Circuits using Delay Fault SimulationHiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu. ats 1998: 108-112 [doi]

1997

Design of C-Testable Multipliers Based on the Modified Booth AlgorithmKwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu. ats 1997: 42-47 [doi]

A Method of Generating Tests for Marginal Delays an Delay Faults in Combinational CircuitsHiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Toshiyuki Matsunaga. ats 1997: 320-325 [doi]

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