Nobuhiro Yanagida - researchr alias

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Viewing Publication 1 - 6 from 6

1999

Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault SimulatorsHiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Nobuhiro Yanagida. ats 1999: 341-346 [doi]

1998

Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based on Sensitized PathsNobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu. ats 1998: 237 [doi]

1996

Multiple Fault Diagnosis in Sequential Circuits Using Sensitizing Sequence PairsNobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu. ftcs 1996: 86-95

1995

Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testingHiroshi Takahashi, Nobuhiro Yanagida, Yuzo Takamatsu. ats 1995: 58-64 [doi]

Multiple Fault Diagnosis by Sensitizing Input PairsNobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu. dt, 12(3):44-52, 1995. [doi]

Multiple fault diagnosis in combinational circuits using sensitizing input-pairsNobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu. scjapan, 26(3):17-29, 1995. [doi]

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