Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Nobuhiro Yanagida. Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault Simulators. In 8th Asian Test Symposium (ATS 99), 16-18 November 1999, Shanghai, China. pages 341-346, IEEE Computer Society, 1999. [doi]
Abstract is missing.