Hiroshi Takahashi, Yukihiro Yamamoto, Yoshinobu Higami, Yuzo Takamatsu. Enhancing BIST Based Single/Multiple Stuck-at Fault Diagnosis by Ambiguous Test Set. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 216-221, IEEE Computer Society, 2004. [doi]
@inproceedings{TakahashiYHT04,
title = {Enhancing BIST Based Single/Multiple Stuck-at Fault Diagnosis by Ambiguous Test Set},
author = {Hiroshi Takahashi and Yukihiro Yamamoto and Yoshinobu Higami and Yuzo Takamatsu},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/ats/2004/2235/00/22350216abs.htm},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/TakahashiYHT04},
cites = {0},
citedby = {0},
pages = {216-221},
booktitle = {13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan},
publisher = {IEEE Computer Society},
isbn = {0-7695-2235-1},
}