A robust algorithm for pessimistic analysis of logic masking effects in combinational circuits - researchr publication authors

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Taiga Takata, Yusuke Matsunaga. A robust algorithm for pessimistic analysis of logic masking effects in combinational circuits. In 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece. pages 246-251, IEEE, 2011. [doi]

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