Taiga Takata, Yusuke Matsunaga. A robust algorithm for pessimistic analysis of logic masking effects in combinational circuits. In 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece. pages 246-251, IEEE, 2011. [doi]
@inproceedings{TakataM11,
title = {A robust algorithm for pessimistic analysis of logic masking effects in combinational circuits},
author = {Taiga Takata and Yusuke Matsunaga},
year = {2011},
doi = {10.1109/IOLTS.2011.5994537},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2011.5994537},
tags = {analysis, logic},
researchr = {https://researchr.org/publication/TakataM11},
cites = {0},
citedby = {0},
pages = {246-251},
booktitle = {17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece},
publisher = {IEEE},
isbn = {978-1-4577-1053-7},
}