Teppei Takeda, Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Yukiya Miura, Kozo Kinoshita. IDDQ Sensing Technique for High Speed IDDQ Testing. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan. pages 111-116, IEEE Computer Society, 2001. [doi]
@inproceedings{TakedaHIYMK01,
title = {IDDQ Sensing Technique for High Speed IDDQ Testing},
author = {Teppei Takeda and Masaki Hashizume and Masahiro Ichimiya and Hiroyuki Yotsuyanagi and Yukiya Miura and Kozo Kinoshita},
year = {2001},
url = {http://csdl.computer.org/comp/proceedings/ats/2001/1378/00/13780111abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/TakedaHIYMK01},
cites = {0},
citedby = {0},
pages = {111-116},
booktitle = {10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan},
publisher = {IEEE Computer Society},
isbn = {0-7695-1378-6},
}