Teppei Takeda, Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Yukiya Miura, Kozo Kinoshita. IDDQ Sensing Technique for High Speed IDDQ Testing. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan. pages 111-116, IEEE Computer Society, 2001. [doi]
Abstract is missing.