Automatic Structural Test Generation for Analog Circuits using Neural Twins - researchr publication authors

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Jonti Talukdar, Arjun Chaudhuri, Mayukh Bhattacharya, Krishnendu Chakrabarty. Automatic Structural Test Generation for Analog Circuits using Neural Twins. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 145-154, IEEE, 2022. [doi]

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