Jonti Talukdar, Arjun Chaudhuri, Mayukh Bhattacharya, Krishnendu Chakrabarty. Automatic Structural Test Generation for Analog Circuits using Neural Twins. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 145-154, IEEE, 2022. [doi]
@inproceedings{TalukdarCBC22,
title = {Automatic Structural Test Generation for Analog Circuits using Neural Twins},
author = {Jonti Talukdar and Arjun Chaudhuri and Mayukh Bhattacharya and Krishnendu Chakrabarty},
year = {2022},
doi = {10.1109/ITC50671.2022.00022},
url = {https://doi.org/10.1109/ITC50671.2022.00022},
researchr = {https://researchr.org/publication/TalukdarCBC22},
cites = {0},
citedby = {0},
pages = {145-154},
booktitle = {IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022},
publisher = {IEEE},
isbn = {978-1-6654-6270-9},
}