Multi-cell soft errors at the 16-nm FinFET technology node

N. Tam, Bharat L. Bhuva, Lloyd W. Massengill, D. Ball, M. McCurdy, Michael L. Alles, Indranil Chatterjee. Multi-cell soft errors at the 16-nm FinFET technology node. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 4, IEEE, 2015. [doi]

Abstract

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