Lloyd W. Massengill - researchr alias

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Viewing Publication 1 - 13 from 13

2021

Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm NodeY. Xiong, A. Feeley, Lloyd W. Massengill, Bharat L. Bhuva, S.-J. Wen, Rita Fung. irps 2021: 1-5 [doi]

2020

Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET TechnologyJ. Cao, L. Xu, S.-J. Wen, R. Fung, Balaji Narasimham, Lloyd W. Massengill, Bharat L. Bhuva. irps 2020: 1-5 [doi]

2019

2018

2015

Multi-cell soft errors at the 16-nm FinFET technology nodeN. Tam, Bharat L. Bhuva, Lloyd W. Massengill, D. Ball, M. McCurdy, Michael L. Alles, Indranil Chatterjee. irps 2015: 4 [doi]

2011

The sensitivity of radiation-induced leakage to STI topology and sidewall dopingNadia Rezzak, Michael L. Alles, Ronald D. Schrimpf, Sarah Kalemeris, Lloyd W. Massengill, John Sochacki, Hugh J. Barnaby. mr, 51(5):889-894, 2011. [doi]

2008

Design Technique for Mitigation of Soft Errors in Differential Switched-Capacitor CircuitsPatrick R. Fleming, Brian D. Olson, W. Timothy Holman, Bharat L. Bhuva, Lloyd W. Massengill. tcas, 55-II(9):838-842, 2008. [doi]

1992

An analog neural hardware implementation using charge-injection multipliers and neutron-specific gain controlLloyd W. Massengill, David Bryan Mundie. tnn, 3(3):354-362, 1992. [doi]

1991

Weight decay and resolution effects in feedforward artificial neural networksDavid Bryan Mundie, Lloyd W. Massengill. tnn, 2(1):168-170, 1991. [doi]

1989

RSIM: A circuit simulation program for VLSI interconnect networksLloyd W. Massengill, Neal Bengtson. simulation, 52(2):68-77, 1989. [doi]

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