H. Zhang, H. Jiang, M. R. Eaker, K. J. Lezon, Balaji Narasimham, Nihaar N. Mahatme, Lloyd W. Massengill, Bharat L. Bhuva. Evaluation on flip-flop physical unclonable functions in a 14/16-nm bulk FinFET technology. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 1, IEEE, 2018. [doi]
Abstract is missing.