J. Cao, L. Xu, Bharat L. Bhuva, S.-J. Wen, R. Wong, Balaji Narasimham, Lloyd W. Massengill. Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-5, IEEE, 2019. [doi]
Abstract is missing.