Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies

J. Cao, L. Xu, Bharat L. Bhuva, S.-J. Wen, R. Wong, Balaji Narasimham, Lloyd W. Massengill. Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-5, IEEE, 2019. [doi]

Authors

J. Cao

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L. Xu

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Bharat L. Bhuva

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S.-J. Wen

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R. Wong

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Balaji Narasimham

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Lloyd W. Massengill

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