L. Xu, J. Cao, B. L. Bhuva, Indranil Chatterjee, S.-J. Wen, R. Wong, Lloyd W. Massengill. Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-5, IEEE, 2019. [doi]
Abstract is missing.