L. Xu, J. Cao, B. L. Bhuva, Indranil Chatterjee, S.-J. Wen, R. Wong, Lloyd W. Massengill. Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-5, IEEE, 2019. [doi]
@inproceedings{XuCBCWWM19, title = {Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology}, author = {L. Xu and J. Cao and B. L. Bhuva and Indranil Chatterjee and S.-J. Wen and R. Wong and Lloyd W. Massengill}, year = {2019}, doi = {10.1109/IRPS.2019.8720514}, url = {https://doi.org/10.1109/IRPS.2019.8720514}, researchr = {https://researchr.org/publication/XuCBCWWM19}, cites = {0}, citedby = {0}, pages = {1-5}, booktitle = {IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019}, publisher = {IEEE}, isbn = {978-1-5386-9504-3}, }