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Off-state drain breakdown mechanisms of VDMOS with anti-JFET implantation

Wing-Shan Tam, Sik-Lam Siu, Bing-Liang Yang, Chi-Wah Kok, Hei Wong. Off-state drain breakdown mechanisms of VDMOS with anti-JFET implantation. Microelectronics Reliability, 51(12):2064-2068, 2011. [doi]

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Wing-Shan Tam

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Sik-Lam Siu

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Bing-Liang Yang

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Chi-Wah Kok

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Hei Wong

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