Off-state drain breakdown mechanisms of VDMOS with anti-JFET implantation

Wing-Shan Tam, Sik-Lam Siu, Bing-Liang Yang, Chi-Wah Kok, Hei Wong. Off-state drain breakdown mechanisms of VDMOS with anti-JFET implantation. Microelectronics Reliability, 51(12):2064-2068, 2011. [doi]

Abstract

Abstract is missing.