Wing-Shan Tam, Sik-Lam Siu, Bing-Liang Yang, Chi-Wah Kok, Hei Wong. Off-state drain breakdown mechanisms of VDMOS with anti-JFET implantation. Microelectronics Reliability, 51(12):2064-2068, 2011. [doi]
@article{TamSYKW11,
title = {Off-state drain breakdown mechanisms of VDMOS with anti-JFET implantation},
author = {Wing-Shan Tam and Sik-Lam Siu and Bing-Liang Yang and Chi-Wah Kok and Hei Wong},
year = {2011},
doi = {10.1016/j.microrel.2011.07.060},
url = {http://dx.doi.org/10.1016/j.microrel.2011.07.060},
researchr = {https://researchr.org/publication/TamSYKW11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {12},
pages = {2064-2068},
}