Lucas A. Tambara, Felipe Almeida, Paolo Rech, Fernanda Lima Kastensmidt, Giovanni Bruni, Christopher Frost. Measuring Failure Probability of Coarse and Fine Grain TMR Schemes in SRAM-based FPGAs Under Neutron-Induced Effects. In Kentaro Sano, Dimitrios Soudris, Michael Hübner, Pedro C. Diniz, editors, Applied Reconfigurable Computing - 11th International Symposium, ARC 2015, Bochum, Germany, April 13-17, 2015, Proceedings. Volume 9040 of Lecture Notes in Computer Science, pages 331-338, Springer, 2015. [doi]
Abstract is missing.