Sarveswara Tammali, Vishal Khatri, Gowrysankar Shanmugam, Mark Terry. DFM aware bridge pair extraction for manufacturing test development. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 812, IEEE, 2010. [doi]
Abstract is missing.