Pre-silicon Noise to Timing Test Methodology

Fern Nee Tan, Jia Yun Chuah. Pre-silicon Noise to Timing Test Methodology. In 29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020. pages 1-2, IEEE, 2020. [doi]

Abstract

Abstract is missing.