Sih Pin Tan, Yung It Ho. Scalability of Post-Silicon Test Generation for Multi-core RISC-V SOC Validation. In 15th IEEE International Symposium on Embedded Multicore/Many-core Systems-on-Chip, MCSoC 2022, Penang, Malaysia, December 19-22, 2022. pages 14-17, IEEE, 2022. [doi]
Abstract is missing.