Yingshui Tan, Baihong Jin, Alexander J. Nettekoven, Yuxin Chen 0001, Yisong Yue, Ufuk Topcu, Alberto L. Sangiovanni-Vincentelli. An Encoder-Decoder Based Approach for Anomaly Detection with Application in Additive Manufacturing. In M. Arif Wani, Taghi M. Khoshgoftaar, Dingding Wang 0001, Huanjing Wang, Naeem Seliya, editors, 18th IEEE International Conference On Machine Learning And Applications, ICMLA 2019, Boca Raton, FL, USA, December 16-19, 2019. pages 1008-1015, IEEE, 2019. [doi]
Abstract is missing.