Tek Jau Tan, Chung-Len Lee. Socillator Test: A Delay Test Scheme for Embedded ICs in the Boundary-Scan Environment. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 158-162, IEEE Computer Society, 2001. [doi]
Abstract is missing.