Xuanyi Tan, Gitanjali Mukherjee, Dhruv Thapar, Arjun Chaudhuri, Sanmitra Banerjee, Rubin A. Parekhji, Krishnendu Chakrabarty. NeuralTPG: GPU-Accelerated Neural Twin-Based Test Pattern Generation for Transition Delay Faults in Safety-Critical Applications. In IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025. pages 161-170, IEEE, 2025. [doi]
Abstract is missing.