Shuhei Tanakamaru, Hiroki Yamazawa, Tsukasa Tokutomi, Sheyang Ning, Ken Takeuchi. Design Methodology for Highly Reliable, High Performance ReRAM and 3-Bit/Cell MLC NAND Flash Solid-State Storage. IEEE Trans. on Circuits and Systems, 62-I(3):844-853, 2015. [doi]
Abstract is missing.