James S. Tandon, Takahiro J. Yamaguchi, Satoshi Komatsu, Kunihiro Asada. A stochastic sampling time-to-digital converter with tunable 180-770fs resolution, INL less than 0.6LSB, and selectable dynamic range offset. In Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, San Jose, CA, USA, September 22-25, 2013. pages 1-4, IEEE, 2013. [doi]
Abstract is missing.