Huaxing Tang, Brady Benware, Michael Reese, Joseph Caroselli, Thomas Herrmann, Friedrich Hapke, Robert Tao, Wu-Tung Cheng, Manish Sharma. Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models. In 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014. pages 318-323, IEEE Computer Society, 2014. [doi]
@inproceedings{TangBRCHHTCS14,
title = {Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models},
author = {Huaxing Tang and Brady Benware and Michael Reese and Joseph Caroselli and Thomas Herrmann and Friedrich Hapke and Robert Tao and Wu-Tung Cheng and Manish Sharma},
year = {2014},
doi = {10.1109/ATS.2014.58},
url = {http://dx.doi.org/10.1109/ATS.2014.58},
researchr = {https://researchr.org/publication/TangBRCHHTCS14},
cites = {0},
citedby = {0},
pages = {318-323},
booktitle = {23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014},
publisher = {IEEE Computer Society},
isbn = {978-1-4799-6030-9},
}