Huaxing Tang, Brady Benware, Michael Reese, Joseph Caroselli, Thomas Herrmann, Friedrich Hapke, Robert Tao, Wu-Tung Cheng, Manish Sharma. Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models. In 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014. pages 318-323, IEEE Computer Society, 2014. [doi]
Abstract is missing.