Intrinsic MOSFET parameter fluctuations due to random dopant placement

Xinghai Tang, Vivek De, James D. Meindl. Intrinsic MOSFET parameter fluctuations due to random dopant placement. IEEE Trans. VLSI Syst., 5(4):369-376, 1997. [doi]

Authors

Xinghai Tang

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Vivek De

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James D. Meindl

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