On Improving Diagnostic Test Generation for Scan Chain Failures

Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. Reddy, Yu Huang. On Improving Diagnostic Test Generation for Scan Chain Failures. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 41-46, IEEE Computer Society, 2009. [doi]

Authors

Xun Tang

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Ruifeng Guo

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Wu-Tung Cheng

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Sudhakar M. Reddy

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Yu Huang

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