Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. Reddy, Yu Huang. On Improving Diagnostic Test Generation for Scan Chain Failures. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 41-46, IEEE Computer Society, 2009. [doi]
Abstract is missing.