Tong Boon Tang, Alan F. Murray, Binjie Cheng, Asen Asenov. Statistical NBTI-effect prediction for ULSI circuits. In International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France. pages 2494-2497, IEEE, 2010. [doi]
Abstract is missing.