Tong Boon Tang, Alan F. Murray, Binjie Cheng, Asen Asenov. A framework to study time-dependent variability in circuits at sub-35nm technology nodes. In 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012. pages 1568-1571, IEEE, 2012. [doi]
Abstract is missing.